Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 261, doi. 10.1007/s10836-022-06012-z
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 3
Results: 9
1
2
Editorial.
- Published in:
- 2022
- By:
- Publication type:
- Editorial
3
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 233, doi. 10.1007/s10836-022-06014-x
- Publication type:
- Article
4
Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 279, doi. 10.1007/s10836-022-06009-8
- By:
- Publication type:
- Article
5
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 289, doi. 10.1007/s10836-022-06008-9
- By:
- Publication type:
- Article
6
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 321, doi. 10.1007/s10836-022-06007-w
- By:
- Publication type:
- Article
7
A Systematic Bit Selection Method for Robust SRAM PUFs.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 235, doi. 10.1007/s10836-022-06006-x
- By:
- Publication type:
- Article
8
Deep Soft Error Propagation Modeling Using Graph Attention Network.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 303, doi. 10.1007/s10836-022-06005-y
- By:
- Publication type:
- Article
9
The Detection of Malicious Modifications in the FPGA.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 3, p. 247, doi. 10.1007/s10836-022-06004-z
- By:
- Publication type:
- Article