Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 2

Results: 9

Editorial.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 125, doi. 10.1007/s10836-022-06003-0

By:

Agrawal, Vishwani D.

Publication type:

Article

Test Technology Newsletter.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 127, doi. 10.1007/s10836-022-06002-1

By:

Di Carlo, Stefano

Publication type:

Article

Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 217, doi. 10.1007/s10836-022-06000-3

By:

Chandaka, Shravani;
Narayanam, Balaji

Publication type:

Article

Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 205, doi. 10.1007/s10836-022-05999-9

By:

Arasteh, Bahman;
Hosseini, Seyed Mohamad Javad

Publication type:

Article

Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 195, doi. 10.1007/s10836-022-05998-w

By:

Huang, Huajie;
Dai, Junjie;
Dou, Long;
Liu, Junfu;
Liu, Yunpeng;
Chen, Taotao;
Wu, Tianxiang;
Li, Junhui

Publication type:

Article

Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 181, doi. 10.1007/s10836-022-05997-x

By:

Siva Balan, N.;
Murugan, B. S.

Publication type:

Article

FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 145, doi. 10.1007/s10836-022-06001-2

By:

Yadav, Dev Narayan;
Thangkhiew, Phrangboklang Lyngton;
Datta, Kamalika;
Chakraborty, Sandip;
Drechsler, Rolf;
Sengupta, Indranil

Publication type:

Article

Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 131, doi. 10.1007/s10836-022-05991-3

By:

Parlar, İshak;
Almali, M. Nuri

Publication type:

Article

An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 2, p. 165, doi. 10.1007/s10836-022-05996-y

By:

Cai, Shuo;
He, Binyong;
Wu, Sicheng;
Wang, Jin;
Wang, Weizheng;
Yu, Fei

Publication type:

Article