Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 1
Results: 11
Editorial.
- Published in:
- 2022
- By:
- Publication type:
- Editorial
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 7, doi. 10.1007/s10836-022-05994-0
- Publication type:
- Article
2021 Reviewers.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 5, doi. 10.1007/s10836-022-05993-1
- Publication type:
- Article
New Editors – 2022.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 3, doi. 10.1007/s10836-022-05992-2
- Publication type:
- Article
Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 91, doi. 10.1007/s10836-022-05990-4
- By:
- Publication type:
- Article
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 63, doi. 10.1007/s10836-022-05989-x
- By:
- Publication type:
- Article
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 21, doi. 10.1007/s10836-022-05988-y
- By:
- Publication type:
- Article
Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 39, doi. 10.1007/s10836-022-05987-z
- By:
- Publication type:
- Article
A Low-cost BIST Design Supporting Offline and Online Tests.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 107, doi. 10.1007/s10836-022-05986-0
- By:
- Publication type:
- Article
A New Neural Network Based on CNN for EMIS Identification.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 77, doi. 10.1007/s10836-022-05985-1
- By:
- Publication type:
- Article
Hardware Obfuscation for IP Protection of DSP Applications.
- Published in:
- Journal of Electronic Testing, 2022, v. 38, n. 1, p. 9, doi. 10.1007/s10836-022-05984-2
- By:
- Publication type:
- Article