Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 1

Results: 11

New Editors – 2022.

Published in:: Journal of Electronic Testing, 2022, v. 38, n. 1, p. 3, doi. 10.1007/s10836-022-05992-2
Publication type:: Article

Editorial.

Published in:

2022

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2022, v. 38, n. 1, p. 7, doi. 10.1007/s10836-022-05994-0
Publication type:: Article

2021 Reviewers.

Published in:: Journal of Electronic Testing, 2022, v. 38, n. 1, p. 5, doi. 10.1007/s10836-022-05993-1
Publication type:: Article

Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 91, doi. 10.1007/s10836-022-05990-4

By:

Bhattacharjee, Abhishek;
Nag, Abhishek;
Das, Kaushik;
Pradhan, Sambhu Nath

Publication type:

Article

A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 63, doi. 10.1007/s10836-022-05989-x

By:

Lu, Yingchun;
Hu, Guangzhen;
Wang, Jianan;
Wang, Hao;
Yao, Liang;
Liang, Huaguo;
Yi, Maoxiang;
Huang, Zhengfeng

Publication type:

Article

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 21, doi. 10.1007/s10836-022-05988-y

By:

Zhao, Yujie;
Katoh, Kentaroh;
Kuwana, Anna;
Katayama, Shogo;
Wei, Jianglin;
Kobayashi, Haruo;
Nakatani, Takayuki;
Hatayama, Kazumi;
Sato, Keno;
Ishida, Takashi;
Okamoto, Toshiyuki;
Ichikawa, Tamotsu

Publication type:

Article

Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 39, doi. 10.1007/s10836-022-05987-z

By:

Bu, Dengli;
Yan, Junjie;
Tang, Pengjie;
Yuan, Haohao

Publication type:

Article

A Low-cost BIST Design Supporting Offline and Online Tests.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 107, doi. 10.1007/s10836-022-05986-0

By:

Menbari, Ahmad;
Jahanirad, Hadi

Publication type:

Article

A New Neural Network Based on CNN for EMIS Identification.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 77, doi. 10.1007/s10836-022-05985-1

By:

Xiao, Ying-chun;
Zhu, Feng;
Zhuang, Sheng-xian;
Yang, Yang

Publication type:

Article

Hardware Obfuscation for IP Protection of DSP Applications.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 1, p. 9, doi. 10.1007/s10836-022-05984-2

By:

R, Naveenkumar;
Sivamangai, N.M.;
A, Napolean;
Nissi, G. Akashraj

Publication type:

Article