Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 5/6
Results: 13
Editorial.
- Published in:
- 2021
- By:
- Publication type:
- Editorial
2020 JETTA-TTTC Best Paper Award.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 571, doi. 10.1007/s10836-021-05982-w
- Publication type:
- Article
TTTC Newsletter.
- Published in:
- 2021
- Publication type:
- Announcement
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 633, doi. 10.1007/s10836-021-05980-y
- By:
- Publication type:
- Article
Stress-Aware Periodic Test of Interconnects.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 715, doi. 10.1007/s10836-021-05979-5
- By:
- Publication type:
- Article
A Framework for Configurable Joint-Scan Design-for-Test Architecture.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 593, doi. 10.1007/s10836-021-05978-6
- By:
- Publication type:
- Article
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 685, doi. 10.1007/s10836-021-05977-7
- By:
- Publication type:
- Article
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 653, doi. 10.1007/s10836-021-05976-8
- By:
- Publication type:
- Article
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 577, doi. 10.1007/s10836-021-05975-9
- By:
- Publication type:
- Article
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 701, doi. 10.1007/s10836-021-05974-w
- By:
- Publication type:
- Article
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 613, doi. 10.1007/s10836-021-05973-x
- By:
- Publication type:
- Article
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 675, doi. 10.1007/s10836-021-05972-y
- By:
- Publication type:
- Article
Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 623, doi. 10.1007/s10836-021-05971-z
- By:
- Publication type:
- Article