Editorial.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 423, doi. 10.1007/s10836-021-05970-0
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 4
Results: 12
1
2
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 425, doi. 10.1007/s10836-021-05969-7
- Publication type:
- Article
3
Review of Manufacturing Process Defects and Their Effects on Memristive Devices.
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- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 427, doi. 10.1007/s10836-021-05968-8
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- Publication type:
- Article
4
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers.
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- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 533, doi. 10.1007/s10836-021-05967-9
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- Publication type:
- Article
5
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 545, doi. 10.1007/s10836-021-05966-w
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- Publication type:
- Article
6
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 515, doi. 10.1007/s10836-021-05965-x
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- Publication type:
- Article
7
Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 439, doi. 10.1007/s10836-021-05964-y
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- Publication type:
- Article
8
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 453, doi. 10.1007/s10836-021-05963-z
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- Publication type:
- Article
9
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 489, doi. 10.1007/s10836-021-05962-0
- By:
- Publication type:
- Article
10
Fault-Aware Dependability Enhancement Techniques for Phase Change Memory.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 503, doi. 10.1007/s10836-021-05961-1
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- Publication type:
- Article
11
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 473, doi. 10.1007/s10836-021-05960-2
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- Publication type:
- Article
12
HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 4, p. 561, doi. 10.1007/s10836-021-05956-y
- By:
- Publication type:
- Article