Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 3
Results: 12
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 287, doi. 10.1007/s10836-021-05959-9
- Publication type:
- Article
Editorial.
- Published in:
- 2021
- By:
- Publication type:
- Editorial
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 369, doi. 10.1007/s10836-021-05955-z
- By:
- Publication type:
- Article
Spectrum Analyzer Based on a Dynamic Filter.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 357, doi. 10.1007/s10836-021-05954-0
- By:
- Publication type:
- Article
Hardware Trojan Free Netlist Identification: A Clustering Approach.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 317, doi. 10.1007/s10836-021-05953-1
- By:
- Publication type:
- Article
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 329, doi. 10.1007/s10836-021-05952-2
- By:
- Publication type:
- Article
Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 289, doi. 10.1007/s10836-021-05951-3
- By:
- Publication type:
- Article
A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 395, doi. 10.1007/s10836-021-05950-4
- By:
- Publication type:
- Article
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 383, doi. 10.1007/s10836-021-05949-x
- By:
- Publication type:
- Article
Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 345, doi. 10.1007/s10836-021-05947-z
- By:
- Publication type:
- Article
A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 305, doi. 10.1007/s10836-021-05946-0
- By:
- Publication type:
- Article
Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 409, doi. 10.1007/s10836-021-05945-1
- By:
- Publication type:
- Article