Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 3

Results: 12

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2021, v. 37, n. 3, p. 287, doi. 10.1007/s10836-021-05959-9
Publication type:: Article

Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 345, doi. 10.1007/s10836-021-05947-z

By:

Boukhari, M. I.;
Oumar, D. A.;
Capraro, S.;
Pietroy, D.;
Chatelon, J. P.;
Rousseau, J. J.

Publication type:

Article

A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 395, doi. 10.1007/s10836-021-05950-4

By:

Taali, M.;
Shirmohammadi, Z.

Publication type:

Article

Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 289, doi. 10.1007/s10836-021-05951-3

By:

Kabin, Ievgen;
Dyka, Zoya;
Klann, Dan;
Aftowicz, Marcin;
Langendoerfer, Peter

Publication type:

Article

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 383, doi. 10.1007/s10836-021-05949-x

By:

Copetti, Thiago;
Cardoso Medeiros, Guilherme;
Taouil, Mottaqiallah;
Hamdioui, Said;
Bolzani Poehls, Letícia;
Balen, Tiago

Publication type:

Article

Editorial.

Published in:

2021

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 369, doi. 10.1007/s10836-021-05955-z

By:

Champac, Victor;
Mesalles, Javier;
Villacorta, Hector;
Vargas, Fabian

Publication type:

Article

Spectrum Analyzer Based on a Dynamic Filter.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 357, doi. 10.1007/s10836-021-05954-0

By:

Herasimov, S.;
Borysenko, M.;
Roshchupkin, E.;
Hrabchak, V. I.;
Nastishin, Yu. A.

Publication type:

Article

Hardware Trojan Free Netlist Identification: A Clustering Approach.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 317, doi. 10.1007/s10836-021-05953-1

By:

Mondal, Anindan;
Biswal, Rajesh Kumar;
Mahalat, Mahabub Hasan;
Roy, Suchismita;
Sen, Bibhash

Publication type:

Article

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 329, doi. 10.1007/s10836-021-05952-2

By:

González, Carlos J.;
Costa, Bruno L.;
Machado, Diego N.;
Vaz, Rafael G.;
Bôas, Alexis C. Vilas;
Gonçalez, Odair L.;
Puchner, Helmut;
Kastensmidt, Fernanda L.;
Medina, Nilberto H.;
Guazzelli, Marcilei A.;
Balen, Tiago R.

Publication type:

Article

Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 409, doi. 10.1007/s10836-021-05945-1

By:

Loh, Felix;
Saluja, Kewal K.;
Ramanathan, Parameswaran

Publication type:

Article

A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 305, doi. 10.1007/s10836-021-05946-0

By:

Bai, Yonghong;
Yan, Zhiyuan

Publication type:

Article