Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 161, doi. 10.1007/s10836-021-05943-3
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 2
Results: 12
1
2
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 159, doi. 10.1007/s10836-021-05957-x
- Publication type:
- Article
3
Editorial.
- Published in:
- 2021
- By:
- Publication type:
- Editorial
4
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 263, doi. 10.1007/s10836-021-05944-2
- By:
- Publication type:
- Article
5
Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 243, doi. 10.1007/s10836-021-05942-4
- By:
- Publication type:
- Article
6
Radiation Tolerant SRAM Cell Design in 65nm Technology.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 255, doi. 10.1007/s10836-021-05941-5
- By:
- Publication type:
- Article
7
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 271, doi. 10.1007/s10836-021-05940-6
- By:
- Publication type:
- Article
8
A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 191, doi. 10.1007/s10836-021-05939-z
- By:
- Publication type:
- Article
9
Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 215, doi. 10.1007/s10836-021-05938-0
- By:
- Publication type:
- Article
10
A Cascaded Multicasting Architecture for Test Data Compression.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 205, doi. 10.1007/s10836-021-05937-1
- By:
- Publication type:
- Article
11
Method of Implanting Hardware Trojan Based on EHW in Part of Circuit.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 279, doi. 10.1007/s10836-021-05936-2
- By:
- Publication type:
- Article
12
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 2, p. 225, doi. 10.1007/s10836-021-05934-4
- By:
- Publication type:
- Article