Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 65, doi. 10.1007/s10836-021-05932-6
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 1
Results: 13
1
2
Editorial.
- Published in:
- 2021
- By:
- Publication type:
- Editorial
3
2020 JETTA Reviewers.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 3, doi. 10.1007/s10836-021-05933-5
- Publication type:
- Article
4
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 41, doi. 10.1007/s10836-021-05926-4
- By:
- Publication type:
- Article
5
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 5, doi. 10.1007/s10836-021-05930-8
- Publication type:
- Article
6
Pre-Silicon Verification Using Multi-FPGA Platforms: A Review.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 7, doi. 10.1007/s10836-021-05929-1
- By:
- Publication type:
- Article
7
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 127, doi. 10.1007/s10836-021-05928-2
- By:
- Publication type:
- Article
8
Estimating Operational Age of an Integrated Circuit.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 25, doi. 10.1007/s10836-021-05927-3
- By:
- Publication type:
- Article
9
Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 151, doi. 10.1007/s10836-021-05931-7
- By:
- Publication type:
- Article
10
Model Transferability from ImageNet to Lithography Hotspot Detection.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 141, doi. 10.1007/s10836-021-05925-5
- By:
- Publication type:
- Article
11
Testing and Diagnosis of Digital Microfluidic Biochips using Multiple Droplets.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 109, doi. 10.1007/s10836-020-05924-y
- By:
- Publication type:
- Article
12
On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 97, doi. 10.1007/s10836-020-05923-z
- By:
- Publication type:
- Article
13
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 1, p. 83, doi. 10.1007/s10836-020-05922-0
- By:
- Publication type:
- Article