Works matching IS 09238174 AND DT 2020 AND VI 36 AND IP 6
2
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 703, doi. 10.1007/s10836-020-05920-2
- Ozen, Elbruz;
- Orailoglu, Alex
- Article
4
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 681, doi. 10.1007/s10836-020-05918-w
- Article
5
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 785, doi. 10.1007/s10836-020-05917-x
- Article
6
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 771, doi. 10.1007/s10836-020-05916-y
- Shang, Yuling;
- Tan, Weipeng;
- Li, Chunquan;
- Fan, Haihua;
- Zeng, Lizhen
- Article
7
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 719, doi. 10.1007/s10836-020-05915-z
- Sanyal, Sayandeep;
- Bhattacharya, Mayukh;
- Patra, Amit;
- Dasgupta, Pallab
- Article
8
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 683, doi. 10.1007/s10836-020-05914-0
- Momtaz, Md Imran;
- Chatterjee, Abhijit
- Article
9
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 743, doi. 10.1007/s10836-020-05913-1
- Gokalan, Akin;
- Tosun, Suleyman;
- Dal, Deniz
- Article
10
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 757, doi. 10.1007/s10836-020-05912-2
- Kheirandish, Davar;
- Haghparast, Majid;
- Reshadi, Midia;
- Hosseinzadeh, Mehdi
- Article
11
- Journal of Electronic Testing, 2020, v. 36, n. 6, p. 731, doi. 10.1007/s10836-020-05911-3
- Meza-Ibarra, I. D.;
- Champac, V.;
- Gomez-Fuentes, R.;
- Noriega, J. R.;
- Vera-Marquina, A.
- Article