Editorial.
- Published in:
- 2020
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2020 AND VI 36 AND IP 5
Results: 11
1
2
Design Development and Testing of High Performance Microwave Frequency Up-Converter.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 631, doi. 10.1007/s10836-020-05909-x
- By:
- Publication type:
- Article
3
Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 671, doi. 10.1007/s10836-020-05908-y
- By:
- Publication type:
- Article
4
TRAP-GATE: A Probabilistic Approach to Enhance Hardware Trojan Detection and its Game Theoretic Analysis.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 607, doi. 10.1007/s10836-020-05907-z
- By:
- Publication type:
- Article
5
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 567, doi. 10.1007/s10836-020-05906-0
- Publication type:
- Article
6
Part I: Evaluation for Hardware Trojan Detection Based on Electromagnetic Radiation.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 591, doi. 10.1007/s10836-020-05905-1
- By:
- Publication type:
- Article
7
Formal Verification of ECCs for Memories Using ACL2.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 643, doi. 10.1007/s10836-020-05904-2
- By:
- Publication type:
- Article
8
Soft Computing Techniques Based CAD Approach for Power Supply Noise Reduction in System-on-Chip.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 665, doi. 10.1007/s10836-020-05903-3
- By:
- Publication type:
- Article
9
Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 577, doi. 10.1007/s10836-020-05902-4
- By:
- Publication type:
- Article
10
A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 617, doi. 10.1007/s10836-020-05901-5
- By:
- Publication type:
- Article
11
Tipping Point Analysis of Electrical Resistance Data with Early Warning Signals of Failure for Predictive Maintenance.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 5, p. 569, doi. 10.1007/s10836-020-05899-w
- By:
- Publication type:
- Article