Editorial.
- Published in:
- 2020
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2020 AND VI 36 AND IP 4
Results: 12
1
2
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 469, doi. 10.1007/s10836-020-05898-x
- By:
- Publication type:
- Article
3
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 441, doi. 10.1007/s10836-020-05897-y
- Publication type:
- Article
4
New Method for Determining and Predicting Test Interconnect Pin Current Carrying Capacity.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 445, doi. 10.1007/s10836-020-05896-z
- By:
- Publication type:
- Article
5
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-Linearity.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 509, doi. 10.1007/s10836-020-05895-0
- By:
- Publication type:
- Article
6
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up Tables.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 519, doi. 10.1007/s10836-020-05894-1
- By:
- Publication type:
- Article
7
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 547, doi. 10.1007/s10836-020-05893-2
- By:
- Publication type:
- Article
8
Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 485, doi. 10.1007/s10836-020-05889-y
- By:
- Publication type:
- Article
9
Low-Power Area-Efficient Fault Tolerant Adder in Current Mode Multi Valued Logic Using Berger Codes.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 555, doi. 10.1007/s10836-020-05887-0
- By:
- Publication type:
- Article
10
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 537, doi. 10.1007/s10836-020-05892-3
- By:
- Publication type:
- Article
11
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 461, doi. 10.1007/s10836-020-05891-4
- By:
- Publication type:
- Article
12
Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 4, p. 499, doi. 10.1007/s10836-020-05890-5
- By:
- Publication type:
- Article