Editorial.
- Published in:
- 2020
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2020 AND VI 36 AND IP 3
Results: 12
1
2
Test Technology Newsletter.
- Published in:
- 2020
- Publication type:
- Announcement
3
Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 313, doi. 10.1007/s10836-020-05885-2
- By:
- Publication type:
- Article
4
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 429, doi. 10.1007/s10836-020-05883-4
- By:
- Publication type:
- Article
5
Time Complexity Comparison of Stopping at First Failure and Completely Running the Test.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 409, doi. 10.1007/s10836-020-05884-3
- By:
- Publication type:
- Article
6
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic Styles.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 343, doi. 10.1007/s10836-020-05882-5
- By:
- Publication type:
- Article
7
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 327, doi. 10.1007/s10836-020-05880-7
- By:
- Publication type:
- Article
8
Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 301, doi. 10.1007/s10836-020-05881-6
- By:
- Publication type:
- Article
9
High Performance Approximate Memories for Image Processing Applications.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 419, doi. 10.1007/s10836-020-05879-0
- By:
- Publication type:
- Article
10
Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 385, doi. 10.1007/s10836-020-05878-1
- By:
- Publication type:
- Article
11
A probability density estimation algorithm on multiwavelet for the high-resolution ADC.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 375, doi. 10.1007/s10836-020-05877-2
- By:
- Publication type:
- Article
12
Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 3, p. 365, doi. 10.1007/s10836-020-05875-4
- By:
- Publication type:
- Article