Works matching IS 09238174 AND DT 2019 AND VI 35 AND IP 3

Results: 13

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2019, v. 35, n. 3, p. 271, doi. 10.1007/s10836-019-05804-0
Publication type:: Article

Design of High Speed Error Tolerant Adder Using Gate Diffusion Input Technique.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 383, doi. 10.1007/s10836-019-05802-2

By:

Geetha, S.;
Amritvalli, P.

Publication type:

Article

Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 367, doi. 10.1007/s10836-019-05806-y

By:

Rodrigues, Gennaro S.;
Barros de Oliveira, Ádria;
Kastensmidt, Fernanda Lima;
Pouget, Vincent;
Bosio, Alberto

Publication type:

Article

Editorial.

Published in:

2019

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Saleh Model and Digital Predistortion for Power Amplifiers in Wireless Communications Using the Third-Order Intercept Point.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 359, doi. 10.1007/s10836-019-05801-3

By:

Al-kanan, Haider;
Yang, Xianzhen;
Li, Fu

Publication type:

Article

Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 335, doi. 10.1007/s10836-019-05799-8

By:

Shafiee, Maryam;
Ozev, Sule

Publication type:

Article

Activity Factor Based Hardware Trojan Detection and Localization.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 293, doi. 10.1007/s10836-019-05803-1

By:

Tang, Yongkang;
Fang, Liang;
Li, Shaoqing

Publication type:

Article

Logic Locking: A Survey of Proposed Methods and Evaluation Metrics.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 273, doi. 10.1007/s10836-019-05800-4

By:

Dupuis, Sophie;
Flottes, Marie-Lise

Publication type:

Article

Testing Signals for Electronics: Criteria for Synthesis.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 349, doi. 10.1007/s10836-019-05798-9

By:

Herasimov, S.;
Pavlii, V.;
Tymoshchuk, O.;
Yakovlev, M.Yu.;
Khaustov, D.Ye.;
Ryzhov, Ye.;
Sakovych, L.;
Nastishin, Yu.A.

Publication type:

Article

Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 303, doi. 10.1007/s10836-019-05797-w

By:

Zandrahimi, Mahroo;
Debaud, Philippe;
Castillejo, Armand;
Al-Ars, Zaid

Publication type:

Article

Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural Networks.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 401, doi. 10.1007/s10836-019-05796-x

By:

Hajian, Ali;
Safari, Saeed

Publication type:

Article

A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal Systems.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 317, doi. 10.1007/s10836-019-05795-y

By:

Kundu, Rahul;
Su, Fei;
Goteti, Prashant

Publication type:

Article

Low Delay 3-Bit Burst Error Correction Codes.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 413, doi. 10.1007/s10836-019-05794-z

By:

Li, Jiaqiang;
Reviriego, Pedro;
Xiao, Liyi

Publication type:

Article