Editorial.
- Published in:
- 2019
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2019 AND VI 35 AND IP 2
Results: 12
1
2
A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 215, doi. 10.1007/s10836-019-05792-1
- By:
- Publication type:
- Article
3
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 163, doi. 10.1007/s10836-019-05791-2
- By:
- Publication type:
- Article
4
Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz).
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 245, doi. 10.1007/s10836-019-05790-3
- By:
- Publication type:
- Article
5
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 129, doi. 10.1007/s10836-019-05789-w
- Publication type:
- Article
6
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 261, doi. 10.1007/s10836-019-05788-x
- By:
- Publication type:
- Article
7
Low-Cost Strategy for Bus Propagation Delay Reduction.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 253, doi. 10.1007/s10836-019-05787-y
- By:
- Publication type:
- Article
8
An Integrated on-Silicon Verification Method for FPGA Overlays.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 173, doi. 10.1007/s10836-019-05786-z
- By:
- Publication type:
- Article
9
Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 145, doi. 10.1007/s10836-019-05785-0
- By:
- Publication type:
- Article
10
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 191, doi. 10.1007/s10836-019-05784-1
- By:
- Publication type:
- Article
11
A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAs.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 201, doi. 10.1007/s10836-019-05783-2
- By:
- Publication type:
- Article
12
Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit Boards.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 131, doi. 10.1007/s10836-019-05782-3
- By:
- Publication type:
- Article