Works matching IS 09238174 AND DT 2019 AND VI 35 AND IP 1
Results: 13
Editorial.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 1, doi. 10.1007/s10836-019-05781-4
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- Article
Design of Two-Tone RF Generator for On-Chip IP3/IP2 Test.
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- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 77, doi. 10.1007/s10836-019-05780-5
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- Article
RTOS Solution for NoC-Based COTS MPSoC Usage in Mixed-Criticality Systems.
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- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 29, doi. 10.1007/s10836-019-05779-y
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- Article
Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy.
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- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 9, doi. 10.1007/s10836-019-05778-z
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- Article
Metric-Driven Verification Methodology with Regression Management.
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- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 101, doi. 10.1007/s10836-019-05777-0
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- Article
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.
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- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 59, doi. 10.1007/s10836-019-05776-1
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- Article
2018JETTAReviewers.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 5, doi. 10.1007/s10836-019-05775-2
- Publication type:
- Article
Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops.
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- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 119, doi. 10.1007/s10836-019-05774-3
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- Article
A Layout-Based Rad-Hard DICE Flip-Flop Design.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 111, doi. 10.1007/s10836-019-05773-4
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- Article
An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 87, doi. 10.1007/s10836-019-05772-5
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- Article
New Editors - 2019.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 3, doi. 10.1007/s10836-019-05771-6
- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 7, doi. 10.1007/s10836-018-05770-z
- Publication type:
- Article
An Optimized NS2 Module for UHF Passive RFID Systems.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 45, doi. 10.1007/s10836-018-5769-y
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- Article