Editorial.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 615, doi. 10.1007/s10836-018-5768-z
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2018 AND VI 34 AND IP 6
Results: 14
1
2
Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video Encryption.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 709, doi. 10.1007/s10836-018-5767-0
- By:
- Publication type:
- Article
3
LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 685, doi. 10.1007/s10836-018-5756-3
- By:
- Publication type:
- Article
4
A Simplified Calibration Methodology for On-Chip Couplers.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 763, doi. 10.1007/s10836-018-5755-4
- By:
- Publication type:
- Article
5
Multiple Missing Cell Defect Modeling for QCA Devices.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 623, doi. 10.1007/s10836-018-5766-1
- By:
- Publication type:
- Article
6
Test Technology Newsletter.
- Published in:
- 2018
- Publication type:
- Letter to the Editor
7
Generation Methodology for Good-Enough Approximate Modules of ATMR.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 651, doi. 10.1007/s10836-018-5764-3
- By:
- Publication type:
- Article
8
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 749, doi. 10.1007/s10836-018-5763-4
- By:
- Publication type:
- Article
9
New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan Attacks.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 697, doi. 10.1007/s10836-018-5762-5
- By:
- Publication type:
- Article
10
Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable Ordering.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 667, doi. 10.1007/s10836-018-5761-6
- By:
- Publication type:
- Article
11
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 735, doi. 10.1007/s10836-018-5760-7
- By:
- Publication type:
- Article
12
2017 JETTA-TTTC Best Paper Award.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 619, doi. 10.1007/s10836-018-5759-0
- Publication type:
- Article
13
Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 643, doi. 10.1007/s10836-018-5758-1
- By:
- Publication type:
- Article
14
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 717, doi. 10.1007/s10836-018-5757-2
- By:
- Publication type:
- Article