Works matching IS 09238174 AND DT 2018 AND VI 34 AND IP 5

Results: 10

Editorial.

Published in:

2018

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power System.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 529, doi. 10.1007/s10836-018-5753-6

By:

Zhang, Shigang;
Wang, Long;
Liu, Ying;
Zhang, Xiaofei;
Yang, Yongmin

Publication type:

Article

Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 559, doi. 10.1007/s10836-018-5752-7

By:

Lu, Shyue-Kung;
Zhong, Shang-Xiu;
Hashizume, Masaki

Publication type:

Article

Test Technology Newsletter.

Published in:: 2018
Publication type:: Proceeding

Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 547, doi. 10.1007/s10836-018-5749-2

By:

Chepelev, Vladimir;
Parfenov, Yury;
Radasky, William;
Titov, Boris;
Zdoukhov, Leonid;
Li, Kejie;
Chen, Yuhao;
Kong, Xu;
Xie, Yan-zhao

Publication type:

Article

High Performance Modified Static Segment Approximate Multiplier based on Significance Probability.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 607, doi. 10.1007/s10836-018-5748-3

By:

Jothin, R.;
Vasanthanayaki, C.

Publication type:

Article

Impact of Aging on the Reliability of Delay PUFs.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 571, doi. 10.1007/s10836-018-5745-6

By:

Karimi, Naghmeh;
Danger, Jean-Luc;
Guilley, Sylvain

Publication type:

Article

Analytical Low Frequency NBTI Compact Modeling with H<sub>2</sub> Locking and Electron Fast Capture and Emission.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 599, doi. 10.1007/s10836-018-5751-8

By:

Qing, J.;
Zeng, Y.;
Li, X. J.;
Zhang, P. J.;
Sun, Y. B.;
Shi, Y. L.

Publication type:

Article

An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 511, doi. 10.1007/s10836-018-5747-4

By:

Osama, Muhammad;
Gaber, Lamya;
Hussein, Aziza I.;
Mahmoud, Hanafy

Publication type:

Article

Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 5, p. 587, doi. 10.1007/s10836-018-5746-5

By:

Yu, Weize;
Wen, Yiming;
Köse, Selçuk;
Chen, Jia

Publication type:

Article