Works matching IS 09238174 AND DT 2018 AND VI 34 AND IP 2
Results: 9
Editorial.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 105, doi. 10.1007/s10836-018-5728-7
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- Publication type:
- Article
Machine Learning for Hardware Security: Opportunities and Risks.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 183, doi. 10.1007/s10836-018-5726-9
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- Publication type:
- Article
The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular Automata.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 109, doi. 10.1007/s10836-018-5723-z
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- Article
Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 147, doi. 10.1007/s10836-018-5721-1
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- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 107, doi. 10.1007/s10836-018-5719-8
- Publication type:
- Article
Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 203, doi. 10.1007/s10836-018-5718-9
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- Publication type:
- Article
Handling Unknown with Blend of Scan and Scan Compression.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 135, doi. 10.1007/s10836-018-5717-x
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- Publication type:
- Article
Application of Machine Learning Techniques in Post-Silicon Debugging and Bug Localization.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 163, doi. 10.1007/s10836-018-5716-y
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- Publication type:
- Article
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 123, doi. 10.1007/s10836-018-5714-0
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- Publication type:
- Article