Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 6
Results: 11
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 695, doi. 10.1007/s10836-017-5690-9
- Publication type:
- Article
Study on Magnetic Probe Calibration in Near-field Measurement System for EMI Application.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 741, doi. 10.1007/s10836-017-5691-8
- By:
- Publication type:
- Article
A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 721, doi. 10.1007/s10836-017-5692-7
- By:
- Publication type:
- Article
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 751, doi. 10.1007/s10836-017-5693-6
- By:
- Publication type:
- Article
A Study of PN Junction Diffusion Capacitance of MOSFET in Presence of Single Event Transient.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 769, doi. 10.1007/s10836-017-5694-5
- By:
- Publication type:
- Article
2016-2017 JETTA Reviewers.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 693, doi. 10.1007/s10836-017-5695-4
- Publication type:
- Article
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 709, doi. 10.1007/s10836-017-5696-3
- By:
- Publication type:
- Article
A Diagnostics Method for Analog Circuits Based on Improved Kernel Entropy Component Analysis.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 697, doi. 10.1007/s10836-017-5697-2
- By:
- Publication type:
- Article
A Low Power Online Test Method for FPGA Single Solder Joint Resistance.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 775, doi. 10.1007/s10836-017-5698-1
- By:
- Publication type:
- Article
Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
2016 JETTA-TTTC Best Paper Award.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 691, doi. 10.1007/s10836-017-5689-2
- Publication type:
- Article