Offline Error Detection in MEDA-Based Digital Microfluidic Biochips Using Oscillation-Based Testing Methodology.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 621, doi. 10.1007/s10836-017-5678-5
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 5
Results: 12
1
2
Efficient Techniques for Fault Detection and Correction of Reversible Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 591, doi. 10.1007/s10836-017-5679-4
- By:
- Publication type:
- Article
3
High Speed Error Tolerant Adder for Multimedia Applications.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 675, doi. 10.1007/s10836-017-5680-y
- By:
- Publication type:
- Article
4
Three-Stage Optimization of Pre-Bond Diagnosis of TSV Defects.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 573, doi. 10.1007/s10836-017-5681-x
- By:
- Publication type:
- Article
5
Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 607, doi. 10.1007/s10836-017-5682-9
- By:
- Publication type:
- Article
6
New Light Weight Threshold Voltage Defined Camouflaged Gates for Trustworthy Designs.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 657, doi. 10.1007/s10836-017-5683-8
- By:
- Publication type:
- Article
7
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 541, doi. 10.1007/s10836-017-5684-7
- Publication type:
- Article
8
Analysing NBTI Impact on SRAMs with Resistive Defects.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 637, doi. 10.1007/s10836-017-5685-6
- By:
- Publication type:
- Article
9
Soft Fault Diagnosis in Analog Circuits Based on Bispectral Models.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 543, doi. 10.1007/s10836-017-5686-5
- By:
- Publication type:
- Article
10
Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
11
A Novel Noise-assisted Prognostic Method for Linear Analog Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 559, doi. 10.1007/s10836-017-5688-3
- By:
- Publication type:
- Article
12
Novel Method for Nondestructive Body Effect Measurement in Dynamic Random Access Memory.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 669, doi. 10.1007/s10836-017-5676-7
- By:
- Publication type:
- Article