Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 4
Results: 13
1
2
A Near-Threshold Soft Error Resilient 7T SRAM Cell with Low Read Time for 20 nm FinFET Technology.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 449, doi. 10.1007/s10836-017-5659-8
- By:
- Publication type:
- Article
3
An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 431, doi. 10.1007/s10836-017-5665-x
- By:
- Publication type:
- Article
4
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 501, doi. 10.1007/s10836-017-5666-9
- By:
- Publication type:
- Article
5
ACM: An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient Applications.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 479, doi. 10.1007/s10836-017-5667-8
- By:
- Publication type:
- Article
6
Susceptible Workload Evaluation and Protection using Selective Fault Tolerance.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 463, doi. 10.1007/s10836-017-5668-7
- By:
- Publication type:
- Article
7
An Access Mechanism for Embedded Sensors in Modern SoCs.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 397, doi. 10.1007/s10836-017-5669-6
- By:
- Publication type:
- Article
8
Hardware Trojan Detection Based on Logical Testing.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 381, doi. 10.1007/s10836-017-5670-0
- By:
- Publication type:
- Article
9
Built-In Fault Localization Circuitry for High Performance FPGA Based Implementations.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 529, doi. 10.1007/s10836-017-5671-z
- By:
- Publication type:
- Article
10
Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 415, doi. 10.1007/s10836-017-5672-y
- By:
- Publication type:
- Article
11
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 379, doi. 10.1007/s10836-017-5673-x
- Publication type:
- Article
12
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 515, doi. 10.1007/s10836-017-5674-9
- By:
- Publication type:
- Article
13
Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect Structure.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 491, doi. 10.1007/s10836-017-5675-8
- By:
- Publication type:
- Article