Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 4
Results: 13
An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 431, doi. 10.1007/s10836-017-5665-x
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- Article
Built-In Fault Localization Circuitry for High Performance FPGA Based Implementations.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 529, doi. 10.1007/s10836-017-5671-z
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- Article
ACM: An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient Applications.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 479, doi. 10.1007/s10836-017-5667-8
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- Article
Susceptible Workload Evaluation and Protection using Selective Fault Tolerance.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 463, doi. 10.1007/s10836-017-5668-7
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- Article
An Access Mechanism for Embedded Sensors in Modern SoCs.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 397, doi. 10.1007/s10836-017-5669-6
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- Article
Hardware Trojan Detection Based on Logical Testing.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 381, doi. 10.1007/s10836-017-5670-0
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- Publication type:
- Article
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 501, doi. 10.1007/s10836-017-5666-9
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- Article
Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 415, doi. 10.1007/s10836-017-5672-y
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 379, doi. 10.1007/s10836-017-5673-x
- Publication type:
- Article
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.
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- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 515, doi. 10.1007/s10836-017-5674-9
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- Publication type:
- Article
Editorial.
- Published in:
- 2017
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- Publication type:
- Editorial
A Near-Threshold Soft Error Resilient 7T SRAM Cell with Low Read Time for 20 nm FinFET Technology.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 449, doi. 10.1007/s10836-017-5659-8
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- Publication type:
- Article
Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect Structure.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 491, doi. 10.1007/s10836-017-5675-8
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- Publication type:
- Article