Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 3

Results: 11

An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 283, doi. 10.1007/s10836-016-5633-x

By:

Sarson, Peter

Publication type:

Article

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 305, doi. 10.1007/s10836-017-5642-4

By:

Zhuang, Yuming;
Chen, Degang

Publication type:

Article

A Passive Authentication System Based on Optical Variable Nano/Micro-Structures.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 353, doi. 10.1007/s10836-017-5645-1

By:

Patel, Jasbir;
Jiang, Hao;
Kaminska, Bozena

Publication type:

Article

Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 315, doi. 10.1007/s10836-017-5648-y

By:

Gómez-Pau, Álvaro;
Balado, Luz;
Figueras, Joan

Publication type:

Article

Fault Diagnosis of Smart Grid Distribution System by Using Smart Sensors and Symlet Wavelet Function.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 329, doi. 10.1007/s10836-017-5658-9

By:

Dhend, Mangal;
Chile, Rajan

Publication type:

Article

New Calibration Technique of Contact-less Resonant Biosensor.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 365, doi. 10.1007/s10836-017-5660-2

By:

Deluthault, Anthony;
Kerzérho, Vincent;
Bernard, Serge;
Soulier, Fabien;
Cauvet, Philippe

Publication type:

Article

A New Test Point Selection Method for Analog Continuous Parameter Fault.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 339, doi. 10.1007/s10836-017-5661-1

By:

Luo, Hui;
Lu, Wei;
Wang, Youren;
Wang, Ling

Publication type:

Article

Past TTTC Events.

Published in:: Journal of Electronic Testing, 2017, v. 33, n. 3, p. 277, doi. 10.1007/s10836-017-5662-0
Publication type:: Article

Guest Editorial: Analog, Mixed-Signal and RF Testing.

Published in:

2017

By:

Barragan, Manuel;
Eisenstadt, William

Publication type:

Editorial

Editorial.

Published in:

2017

By:

Agrawal, Vishwani

Publication type:

Editorial

Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 3, p. 295, doi. 10.1007/s10836-016-5630-0

By:

Sarson, Peter;
Kobayashi, Haruo

Publication type:

Article