Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 3
Results: 11
A Passive Authentication System Based on Optical Variable Nano/Micro-Structures.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 353, doi. 10.1007/s10836-017-5645-1
- By:
- Publication type:
- Article
An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 283, doi. 10.1007/s10836-016-5633-x
- By:
- Publication type:
- Article
ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 305, doi. 10.1007/s10836-017-5642-4
- By:
- Publication type:
- Article
Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 315, doi. 10.1007/s10836-017-5648-y
- By:
- Publication type:
- Article
Fault Diagnosis of Smart Grid Distribution System by Using Smart Sensors and Symlet Wavelet Function.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 329, doi. 10.1007/s10836-017-5658-9
- By:
- Publication type:
- Article
New Calibration Technique of Contact-less Resonant Biosensor.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 365, doi. 10.1007/s10836-017-5660-2
- By:
- Publication type:
- Article
A New Test Point Selection Method for Analog Continuous Parameter Fault.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 339, doi. 10.1007/s10836-017-5661-1
- By:
- Publication type:
- Article
Past TTTC Events.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 277, doi. 10.1007/s10836-017-5662-0
- Publication type:
- Article
Guest Editorial: Analog, Mixed-Signal and RF Testing.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 3, p. 295, doi. 10.1007/s10836-016-5630-0
- By:
- Publication type:
- Article