Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and Passivation.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 255, doi. 10.1007/s10836-017-5647-z
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 2
Results: 11
1
2
Reliability Model for Multiple-Error Protected Static Memories.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 189, doi. 10.1007/s10836-017-5649-x
- By:
- Publication type:
- Article
3
A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 147, doi. 10.1007/s10836-017-5650-4
- By:
- Publication type:
- Article
4
VI-Based Measurement System Focusing on Space Applications.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 267, doi. 10.1007/s10836-017-5651-3
- By:
- Publication type:
- Article
5
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency Scaling.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 171, doi. 10.1007/s10836-017-5652-2
- By:
- Publication type:
- Article
6
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 143, doi. 10.1007/s10836-017-5653-1
- Publication type:
- Article
7
Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
8
A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip Networks.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 227, doi. 10.1007/s10836-017-5655-z
- By:
- Publication type:
- Article
9
A Parallel Test Application Method towards Power Reduction.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 157, doi. 10.1007/s10836-017-5656-y
- By:
- Publication type:
- Article
10
A Bridged Contactless Measurement Technique for LC Tank Based Voltage-Controlled Oscillator.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 261, doi. 10.1007/s10836-017-5657-x
- By:
- Publication type:
- Article
11
Link Testing: a Survey of Current Trends in Network on Chip.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 209, doi. 10.1007/s10836-017-5646-0
- By:
- Publication type:
- Article