Golden-Free Hardware Trojan Detection with High Sensitivity Under Process Noise.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 107, doi. 10.1007/s10836-016-5632-y
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 1
Results: 12
1
2
High Speed Energy Efficient Static Segment Adder for Approximate Computing Applications.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 125, doi. 10.1007/s10836-016-5634-9
- By:
- Publication type:
- Article
3
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 37, doi. 10.1007/s10836-016-5635-8
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- Publication type:
- Article
4
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
- Publication type:
- Article
5
A High-Level Approach to Analyze the Effects of Soft Errors on Lossless Compression Algorithms.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 53, doi. 10.1007/s10836-016-5637-6
- By:
- Publication type:
- Article
6
Test Planning for Core-based Integrated Circuits under Power Constraints.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 7, doi. 10.1007/s10836-016-5638-5
- By:
- Publication type:
- Article
7
Fast and Automated Electromigration Analysis for CMOS RF PA Design.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 133, doi. 10.1007/s10836-016-5639-4
- By:
- Publication type:
- Article
8
A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 25, doi. 10.1007/s10836-017-5640-6
- By:
- Publication type:
- Article
9
On the Consolidation of Mixed Criticalities Applications on Multicore Architectures.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 65, doi. 10.1007/s10836-016-5636-7
- By:
- Publication type:
- Article
10
A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded Systems.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 77, doi. 10.1007/s10836-017-5643-3
- By:
- Publication type:
- Article
11
Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
12
An Efficient Reverse Engineering Hardware Trojan Detector Using Histogram of Oriented Gradients.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 93, doi. 10.1007/s10836-016-5631-z
- By:
- Publication type:
- Article