Four-Port Network Parameters Extraction Method for Partially Depleted SOI with Body-Contact Structure.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 763, doi. 10.1007/s10836-016-5625-x
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2016 AND VI 32 AND IP 6
Results: 11
1
2
An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 721, doi. 10.1007/s10836-016-5621-1
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- Publication type:
- Article
3
A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 749, doi. 10.1007/s10836-016-5622-0
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- Publication type:
- Article
4
Mahalanobis Distance Based Approach for Anomaly Detection of Analog Filters Using Frequency Features and Parzen Window Density Estimation.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 681, doi. 10.1007/s10836-016-5623-z
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- Publication type:
- Article
5
Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 695, doi. 10.1007/s10836-016-5624-y
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- Publication type:
- Article
6
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 661, doi. 10.1007/s10836-016-5620-2
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- Publication type:
- Article
7
New Methodology for Complete Properties Extraction from Simulation Traces Guided with Static Analysis.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 705, doi. 10.1007/s10836-016-5626-9
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- Publication type:
- Article
8
2015 JETTA-TTTC Best Paper Award.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 659, doi. 10.1007/s10836-016-5627-8
- Publication type:
- Article
9
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 655, doi. 10.1007/s10836-016-5628-7
- Publication type:
- Article
10
Editorial.
- Published in:
- 2016
- By:
- Publication type:
- Editorial
11
Optimal Selective Count Compatible Runlength Encoding for SOC Test Data Compression.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 735, doi. 10.1007/s10836-016-5617-x
- By:
- Publication type:
- Article