A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock Testing.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 403, doi. 10.1007/s10836-015-5536-2
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2015 AND VI 31 AND IP 4
Results: 10
1
2
A High Performance SEU Tolerant Latch.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 349, doi. 10.1007/s10836-015-5533-5
- By:
- Publication type:
- Article
3
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 381, doi. 10.1007/s10836-015-5534-4
- By:
- Publication type:
- Article
4
Application of Contactless Testing to PCBs with BGAs and Open Sockets.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 339, doi. 10.1007/s10836-015-5535-3
- By:
- Publication type:
- Article
5
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 411, doi. 10.1007/s10836-015-5537-1
- By:
- Publication type:
- Article
6
A Novel Built-in Current Sensor for N-WELL SET Detection.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 395, doi. 10.1007/s10836-015-5538-0
- By:
- Publication type:
- Article
7
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 337, doi. 10.1007/s10836-015-5539-z
- Publication type:
- Article
8
Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 361, doi. 10.1007/s10836-015-5540-6
- By:
- Publication type:
- Article
9
Erratum to: A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator.
- Published in:
- 2015
- By:
- Publication type:
- Erratum
10
Editorial.
- Published in:
- 2015
- By:
- Publication type:
- Editorial