A New On-chip Signal Generator for Charge-Based Capacitance Measurement Circuit.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 329, doi. 10.1007/s10836-015-5526-4
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2015 AND VI 31 AND IP 3
Results: 10
1
2
Contactless Testing of Circuit Interconnects.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 229, doi. 10.1007/s10836-015-5524-6
- By:
- Publication type:
- Article
3
Distributed Scan Like Fault Detection and Test Optimization for Digital Microfluidic Biochips.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 311, doi. 10.1007/s10836-015-5525-5
- By:
- Publication type:
- Article
4
One More Class of Sequential Circuits having Combinational Test Generation Complexity.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 321, doi. 10.1007/s10836-015-5527-3
- By:
- Publication type:
- Article
5
Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 275, doi. 10.1007/s10836-015-5529-1
- By:
- Publication type:
- Article
6
A Unified Sequential Equivalence Checking Methodology to Verify RTL Designs with High-Level Functional and Protocol Specification Models.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 255, doi. 10.1007/s10836-015-5528-2
- By:
- Publication type:
- Article
7
A New Approach to Model the Effect of Topology on Testing Using Boundary Scan.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 301, doi. 10.1007/s10836-015-5530-8
- By:
- Publication type:
- Article
8
A Hilbert-Transform-Based Method to Estimate and Correct Timing Error in Time-Interleaved ADCs.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 291, doi. 10.1007/s10836-015-5523-7
- By:
- Publication type:
- Article
9
Editorial.
- Published in:
- 2015
- By:
- Publication type:
- Editorial
10
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 227, doi. 10.1007/s10836-015-5532-6
- Publication type:
- Article