Works matching IS 09238174 AND DT 2015 AND VI 31 AND IP 2

Results: 10

Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 127, doi. 10.1007/s10836-015-5516-6

By:

Lee, Hsun-Cheng;
Abraham, Jacob

Publication type:

Article

A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 181, doi. 10.1007/s10836-015-5517-5

By:

Huang, Ryan;
Hsu, Dennis;
Wen, Charles

Publication type:

Article

Reusing RTL Assertion Checkers for Verification of SystemC TLM Models.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 167, doi. 10.1007/s10836-015-5514-8

By:

Bombieri, Nicola;
Fummi, Franco;
Guarnieri, Valerio;
Pravadelli, Graziano;
Stefanni, Francesco;
Ghasempouri, Tara;
Lora, Michele;
Auditore, Giovanni;
Marcigaglia, Mirella

Publication type:

Article

A Shift-Register Based BIST Architecture for FPGA Global Interconnect Testing and Diagnosis.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 207, doi. 10.1007/s10836-015-5515-7

By:

Pereira, Igor;
Dias, Leonardo;
Souza, Cleonilson

Publication type:

Article

Scalable and Optimized Hybrid Verification of Embedded Software.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 151, doi. 10.1007/s10836-015-5518-4

By:

Behrend, Jörg;
Lettnin, Djones;
Grünhage, Alexander;
Ruf, Jürgen;
Kropf, Thomas;
Rosenstiel, Wolfgang

Publication type:

Article

Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 193, doi. 10.1007/s10836-015-5519-3

By:

Chen, Liang;
Ebrahimi, Mojtaba;
Tahoori, Mehdi

Publication type:

Article

Analog Circuits Soft Fault Diagnosis Using Rényi's Entropy.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 217, doi. 10.1007/s10836-015-5520-x

By:

Xie, Xuan;
Li, Xifeng;
Bi, Dongjie;
Zhou, Qizhong;
Xie, Sanshan;
Xie, Yongle

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2015, v. 31, n. 2, p. 125, doi. 10.1007/s10836-015-5521-9
Publication type:: Article

Editorial.

Published in:

2015

By:

Agrawal, Vishwani

Publication type:

Editorial

Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 2, p. 139, doi. 10.1007/s10836-015-5513-9

By:

Restrepo-Calle, Felipe;
Cuenca-Asensi, Sergio;
Martínez-Álvarez, Antonio;
Chielle, Eduardo;
Kastensmidt, Fernanda

Publication type:

Article