On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current Tuning.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 67, doi. 10.1007/s10836-014-5496-y
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2015 AND VI 31 AND IP 1
Results: 15
1
2
Pseudo Functional Path Delay Test through Embedded Memories.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 35, doi. 10.1007/s10836-014-5497-x
- By:
- Publication type:
- Article
3
Compressive Sampling Coupled OFDM Technique for Testing Continuous Wave Radar.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 75, doi. 10.1007/s10836-014-5501-5
- By:
- Publication type:
- Article
4
Pattern Generation for Understanding Timing Sensitivity to Power Supply Noise.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 99, doi. 10.1007/s10836-014-5502-4
- By:
- Publication type:
- Article
5
A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 43, doi. 10.1007/s10836-015-5507-7
- By:
- Publication type:
- Article
6
Detecting Hardware Trojans using On-chip Sensors in an ASIC Design.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 11, doi. 10.1007/s10836-015-5504-x
- By:
- Publication type:
- Article
7
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 85, doi. 10.1007/s10836-015-5505-9
- By:
- Publication type:
- Article
8
Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 107, doi. 10.1007/s10836-014-5495-z
- By:
- Publication type:
- Article
9
Harzard-Based ATPG for Improving Delay Test Quality.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 27, doi. 10.1007/s10836-014-5503-3
- By:
- Publication type:
- Article
10
A New Test Point Selection Method for Analog Circuit.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 53, doi. 10.1007/s10836-015-5506-8
- By:
- Publication type:
- Article
11
New Editors - 2015.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 3, doi. 10.1007/s10836-015-5512-x
- Publication type:
- Article
12
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 9, doi. 10.1007/s10836-015-5508-6
- Publication type:
- Article
13
Analog Circuit Fault Diagnosis via Sensitivity Computation.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 119, doi. 10.1007/s10836-015-5509-5
- By:
- Publication type:
- Article
14
2014 JETTA Reviewers.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 7, doi. 10.1007/s10836-015-5510-z
- Publication type:
- Article
15
Editorial.
- Published in:
- 2015
- By:
- Publication type:
- Editorial