Three-Level Management Algorithm to Increase the SEU Emulation Rate in DPR Based Emulators.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 739, doi. 10.1007/s10836-014-5489-x
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 6
Results: 14
1
2
Characterization of a Passive Telemetric System for ISM Band Pressure Sensors.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 665, doi. 10.1007/s10836-014-5485-1
- By:
- Publication type:
- Article
3
On-line Condition Monitoring and Maintenance of Power Electronic Converters.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 701, doi. 10.1007/s10836-014-5491-3
- By:
- Publication type:
- Article
4
Low-Cost Concurrent Error Detection for GCM and CCM.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 725, doi. 10.1007/s10836-014-5494-0
- By:
- Publication type:
- Article
5
A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 653, doi. 10.1007/s10836-014-5486-0
- By:
- Publication type:
- Article
6
Access Port Protection for Reconfigurable Scan Networks.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 711, doi. 10.1007/s10836-014-5484-2
- By:
- Publication type:
- Article
7
Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 763, doi. 10.1007/s10836-014-5490-4
- By:
- Publication type:
- Article
8
Testing Disturbance Faults in Various NAND Flash Memories.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 643, doi. 10.1007/s10836-014-5487-z
- By:
- Publication type:
- Article
9
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 687, doi. 10.1007/s10836-014-5488-y
- By:
- Publication type:
- Article
10
Single Event Resilient Dynamic Logic Designs.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 751, doi. 10.1007/s10836-014-5492-2
- By:
- Publication type:
- Article
11
2013 JETTA-TTTC Best Paper Award.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 639, doi. 10.1007/s10836-014-5498-9
- Publication type:
- Article
12
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 641, doi. 10.1007/s10836-014-5493-1
- Publication type:
- Article
13
Editorial.
- Published in:
- 2014
- By:
- Publication type:
- Editorial
14
Efficient LFSR Reseeding Based on Internal-Response Feedback.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 673, doi. 10.1007/s10836-014-5482-4
- By:
- Publication type:
- Article