Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 5

Results: 13

On the Test and Mitigation of Malfunctions in Low-Power SRAMs.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 611, doi. 10.1007/s10836-014-5479-z

By:

Bonet Zordan, L.;
Bosio, A.;
Dilillo, L.;
Girard, P.;
Virazel, A.;
Badereddine, N.

Publication type:

Article

A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 595, doi. 10.1007/s10836-014-5476-2

By:

Pahlevanzadeh, Hoda;
Yu, Qiaoyan

Publication type:

Article

Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and Information Fusion.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 505, doi. 10.1007/s10836-014-5478-0

By:

Xie, Tao;
He, Yigang

Publication type:

Article

Editorial.

Published in:

2014

By:

Agrawal, Vishwani

Publication type:

Editorial

Testing Methods for PUF-Based Secure Key Storage Circuits.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 581, doi. 10.1007/s10836-014-5471-7

By:

Cortez, Mafalda;
Roelofs, Gijs;
Hamdioui, Said;
Natale, Giorgio

Publication type:

Article

Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 557, doi. 10.1007/s10836-014-5472-6

By:

Eggersglüß, Stephan

Publication type:

Article

Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency Scaling.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 569, doi. 10.1007/s10836-014-5473-5

By:

Millican, Spencer;
Saluja, Kewal

Publication type:

Article

Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 515, doi. 10.1007/s10836-014-5474-4

By:

Hsiao, Sen-Wen;
Wang, Xian;
Chatterjee, Abhijit

Publication type:

Article

Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 629, doi. 10.1007/s10836-014-5475-3

By:

Wang, Zhigang;
Guo, Lianping;
Tian, Shulin;
Liu, Tao

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2014, v. 30, n. 5, p. 493, doi. 10.1007/s10836-014-5480-6
Publication type:: Article

Adaptive Bayesian Diagnosis of Intermittent Faults.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 527, doi. 10.1007/s10836-014-5477-1

By:

Gómez, Laura;
Cook, Alejandro;
Indlekofer, Thomas;
Hellebrand, Sybille;
Wunderlich, Hans-Joachim

Publication type:

Article

Intra-Cell Defects Diagnosis.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 541, doi. 10.1007/s10836-014-5481-5

By:

Sun, Z.;
Bosio, A.;
Dilillo, L.;
Girard, P.;
Pravossoudovich, S.;
Virazel, A.;
Auvray, E.

Publication type:

Article

Dynamic Threshold Delay Characterization Model for Improved Static Timing Analysis.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 495, doi. 10.1007/s10836-014-5469-1

By:

Bhatnagar, Pulkit;
Garg, Sachin

Publication type:

Article