Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 5
Results: 13
Testing Methods for PUF-Based Secure Key Storage Circuits.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 581, doi. 10.1007/s10836-014-5471-7
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- Publication type:
- Article
Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets.
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- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 557, doi. 10.1007/s10836-014-5472-6
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- Publication type:
- Article
Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency Scaling.
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- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 569, doi. 10.1007/s10836-014-5473-5
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- Publication type:
- Article
Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters.
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- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 515, doi. 10.1007/s10836-014-5474-4
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- Publication type:
- Article
Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 629, doi. 10.1007/s10836-014-5475-3
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- Article
A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 595, doi. 10.1007/s10836-014-5476-2
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- Article
Adaptive Bayesian Diagnosis of Intermittent Faults.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 527, doi. 10.1007/s10836-014-5477-1
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- Publication type:
- Article
Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and Information Fusion.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 505, doi. 10.1007/s10836-014-5478-0
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- Publication type:
- Article
On the Test and Mitigation of Malfunctions in Low-Power SRAMs.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 611, doi. 10.1007/s10836-014-5479-z
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 493, doi. 10.1007/s10836-014-5480-6
- Publication type:
- Article
Intra-Cell Defects Diagnosis.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 541, doi. 10.1007/s10836-014-5481-5
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- Publication type:
- Article
Editorial.
- Published in:
- 2014
- By:
- Publication type:
- Editorial
Dynamic Threshold Delay Characterization Model for Improved Static Timing Analysis.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 5, p. 495, doi. 10.1007/s10836-014-5469-1
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- Publication type:
- Article