Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 4
Results: 10
A Functional Approach for Testing the Reorder Buffer Memory.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 469, doi. 10.1007/s10836-014-5461-9
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- Publication type:
- Article
The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case Study.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 457, doi. 10.1007/s10836-014-5462-8
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- Publication type:
- Article
Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAs.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 425, doi. 10.1007/s10836-014-5463-7
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- Publication type:
- Article
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 415, doi. 10.1007/s10836-014-5464-6
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- Publication type:
- Article
Enhanced Low Complex Double Error Correction Coding with Crosstalk Avoidance for Reliable On-Chip Interconnection Link.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 387, doi. 10.1007/s10836-014-5465-5
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- Publication type:
- Article
Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal Classifiers.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 443, doi. 10.1007/s10836-014-5466-4
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 385, doi. 10.1007/s10836-014-5467-3
- Publication type:
- Article
Fault Detection of Linear Analog Integrated Circuit in Network.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 483, doi. 10.1007/s10836-014-5468-2
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- Publication type:
- Article
Editorial.
- Published in:
- 2014
- By:
- Publication type:
- Editorial
A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 401, doi. 10.1007/s10836-014-5459-3
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- Publication type:
- Article