Works matching IS 09238174 AND DT 2013 AND VI 29 AND IP 2

Results: 14

CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 143, doi. 10.1007/s10836-013-5365-0

By:

Chen, Liang;
Ebrahimi, Mojtaba;
Tahoori, Mehdi

Publication type:

Article

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 249, doi. 10.1007/s10836-013-5364-1

By:

Zhang, Zhichao;
Ren, Yi;
Chen, Li;
Gaspard, Nelson;
Witulski, Arthur.;
Holman, Timothy;
Bhuva, Bharat;
Wen, Shi-Jie;
Sammynaiken, Ramaswami

Publication type:

Article

Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 223, doi. 10.1007/s10836-013-5372-1

By:

Romero, Edgar;
Strum, Marius;
Chau, Wang

Publication type:

Article

Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 211, doi. 10.1007/s10836-013-5371-2

By:

Bergaoui, S.;
Wecxsteen, A.;
Leveugle, R.

Publication type:

Article

Novel Self-Timed, Pipelined Clock Scan Architecture.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 241, doi. 10.1007/s10836-013-5363-2

By:

Chakraborty, Kanad;
Kelly, James;
Evans, Brian

Publication type:

Article

Reliability-Aware Heterogeneous 3D Chip Multiprocessor Design.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 177, doi. 10.1007/s10836-013-5373-0

By:

Akturk, Ismail;
Ozturk, Ozcan

Publication type:

Article

On the Simulation of HCI-Induced Variations of IC Timings at High Level.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 127, doi. 10.1007/s10836-013-5368-x

By:

Heron, Olivier;
Bertolini, Clement;
Sandionigi, Chiara;
Ventroux, Nicolas;
Marc, Francois

Publication type:

Article

Guest Editorial.

Published in:

2013

By:

Gizopoulos, Dimitris;
Hamdioui, Said;
Manhaeve, Hans

Publication type:

Editorial

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2013, v. 29, n. 2, p. 123, doi. 10.1007/s10836-013-5366-z
Publication type:: Article

Secure JTAG Implementation Using Schnorr Protocol.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 193, doi. 10.1007/s10836-013-5369-9

By:

Das, Amitabh;
Rolt, Jean;
Ghosh, Santosh;
Seys, Stefaan;
Dupuis, Sophie;
Natale, Giorgio;
Flottes, Marie-Lise;
Rouzeyre, Bruno;
Verbauwhede, Ingrid

Publication type:

Article

Editorial.

Published in:

2013

By:

Agrawal, Vishwani

Publication type:

Editorial

Circuit Level Concurrent Error Detection in FSMs.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 185, doi. 10.1007/s10836-013-5375-y

By:

Kehl, Natalja;
Rosenstiel, Wolfgang

Publication type:

Article

Self-Adaptive Fault Tolerance in Multi-/Many-Core Systems.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 159, doi. 10.1007/s10836-013-5367-y

By:

Bolchini, Cristiana;
Carminati, Matteo;
Miele, Antonio

Publication type:

Article

Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 2, p. 237, doi. 10.1007/s10836-013-5370-3

By:

Kavithamani, A.;
Manikandan, V.;
Devarajan, N.

Publication type:

Article