Works matching IS 09238174 AND DT 2013 AND VI 29 AND IP 2
Results: 14
Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification.
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- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 223, doi. 10.1007/s10836-013-5372-1
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- Article
CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis.
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- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 143, doi. 10.1007/s10836-013-5365-0
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- Article
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients.
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- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 249, doi. 10.1007/s10836-013-5364-1
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- Article
Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems.
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- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 211, doi. 10.1007/s10836-013-5371-2
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- Article
Novel Self-Timed, Pipelined Clock Scan Architecture.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 241, doi. 10.1007/s10836-013-5363-2
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- Article
Reliability-Aware Heterogeneous 3D Chip Multiprocessor Design.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 177, doi. 10.1007/s10836-013-5373-0
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- Publication type:
- Article
Guest Editorial.
- Published in:
- 2013
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- Publication type:
- Editorial
On the Simulation of HCI-Induced Variations of IC Timings at High Level.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 127, doi. 10.1007/s10836-013-5368-x
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- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 123, doi. 10.1007/s10836-013-5366-z
- Publication type:
- Article
Secure JTAG Implementation Using Schnorr Protocol.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 193, doi. 10.1007/s10836-013-5369-9
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- Publication type:
- Article
Editorial.
- Published in:
- 2013
- By:
- Publication type:
- Editorial
Circuit Level Concurrent Error Detection in FSMs.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 185, doi. 10.1007/s10836-013-5375-y
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- Article
Self-Adaptive Fault Tolerance in Multi-/Many-Core Systems.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 159, doi. 10.1007/s10836-013-5367-y
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- Publication type:
- Article
Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 237, doi. 10.1007/s10836-013-5370-3
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- Publication type:
- Article