Works matching IS 09238174 AND DT 2013 AND VI 29 AND IP 1
Results: 13
A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 95, doi. 10.1007/s10836-012-5342-z
- By:
- Publication type:
- Article
2012 JETTA Reviewers.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 5, doi. 10.1007/s10836-013-5350-7
- Publication type:
- Article
Testing of Synchronizers in Asynchronous FIFO.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 49, doi. 10.1007/s10836-013-5349-0
- By:
- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 7, doi. 10.1007/s10836-013-5348-1
- Publication type:
- Article
Applying Petri Nets to Modeling of Many-Core Processor Self-Testing when Tests are Performed Randomly.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 25, doi. 10.1007/s10836-012-5346-8
- By:
- Publication type:
- Article
New Editors, 2013.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 3, doi. 10.1007/s10836-013-5354-3
- Publication type:
- Article
Analog Circuits Fault Detection Using Cross-Entropy Approach.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 115, doi. 10.1007/s10836-012-5344-x
- By:
- Publication type:
- Article
SEU Fault-Injection in VHDL-Based Processors: A Case Study.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 87, doi. 10.1007/s10836-013-5351-6
- By:
- Publication type:
- Article
Evaluating Different Strategies for Testing Software Product Lines.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 9, doi. 10.1007/s10836-012-5343-y
- By:
- Publication type:
- Article
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 35, doi. 10.1007/s10836-012-5345-9
- By:
- Publication type:
- Article
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 73, doi. 10.1007/s10836-012-5347-7
- By:
- Publication type:
- Article
Eliminating the Timing Penalty of Scan.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 103, doi. 10.1007/s10836-013-5352-5
- By:
- Publication type:
- Article
Editorial.
- Published in:
- 2013
- By:
- Publication type:
- Editorial