Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 6

Results: 12

A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 803, doi. 10.1007/s10836-012-5334-z

By:

Benfica, Juliano;
Bolzani Poehls, Letícia;
Vargas, Fabian;
Lipovetzky, José;
Lutenberg, Ariel;
Gatti, Edmundo;
Hernandez, Fernando

Publication type:

Article

Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 865, doi. 10.1007/s10836-012-5337-9

By:

Ruiz, J.;
Fernández-Garcia, R.;
Gil, I.;
Morata, M.

Publication type:

Article

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 777, doi. 10.1007/s10836-012-5321-4

By:

Portela-Garcia, M.;
Lindoso, A.;
Entrena, L.;
Garcia-Valderas, M.;
Lopez-Ongil, C.;
Marroni, N.;
Pianta, B.;
Bolzani Poehls, L.;
Vargas, F.

Publication type:

Article

A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 843, doi. 10.1007/s10836-012-5333-0

By:

Neophytou, Stelios;
Christou, Kyriakos;
Michael, Maria

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2012, v. 28, n. 6, p. 775, doi. 10.1007/s10836-012-5340-1
Publication type:: Article

Structural Test and Diagnosis for Graceful Degradation of NoC Switches.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 831, doi. 10.1007/s10836-012-5329-9

By:

Dalirsani, Atefe;
Holst, Stefan;
Elm, Melanie;
Wunderlich, Hans-Joachim

Publication type:

Article

K-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 817, doi. 10.1007/s10836-012-5322-3

By:

Pasca, Vladimir;
Anghel, Lorena;
Benabdenbi, Mounir

Publication type:

Article

Editorial.

Published in:

2012

By:

Agrawal, Vishwani

Publication type:

Editorial

Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB.

Published in:

2012

By:

Chakraborty, Kanad;
Agrawal, Vishwani

Publication type:

Letter

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 877, doi. 10.1007/s10836-012-5338-8

By:

Ren, Y.;
Fan, L.;
Chen, L.;
Wen, S.-J.;
Wong, R.;
Vonno, N.;
Witulski, A.;
Bhuva, B.

Publication type:

Article

Current State of the Mixed-Signal Test Bus 1149.4.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 857, doi. 10.1007/s10836-012-5339-7

By:

Hannu, Jari;
Häkkinen, Juha;
Voutilainen, Juha-Veikko;
Jantunen, Heli;
Moilanen, Markku

Publication type:

Article

Prediction of Long-term Immunity of a Phase-Locked Loop.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 791, doi. 10.1007/s10836-012-5335-y

By:

Boyer, A.;
Ben Dhia, S.;
Li, B.;
Lemoine, C.;
Vrignon, B.

Publication type:

Article