Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 6
Results: 12
Structural Test and Diagnosis for Graceful Degradation of NoC Switches.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 831, doi. 10.1007/s10836-012-5329-9
- By:
- Publication type:
- Article
K-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 817, doi. 10.1007/s10836-012-5322-3
- By:
- Publication type:
- Article
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 777, doi. 10.1007/s10836-012-5321-4
- By:
- Publication type:
- Article
Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB.
- Published in:
- 2012
- By:
- Publication type:
- Letter
A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 843, doi. 10.1007/s10836-012-5333-0
- By:
- Publication type:
- Article
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 803, doi. 10.1007/s10836-012-5334-z
- By:
- Publication type:
- Article
Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 865, doi. 10.1007/s10836-012-5337-9
- By:
- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 775, doi. 10.1007/s10836-012-5340-1
- Publication type:
- Article
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 877, doi. 10.1007/s10836-012-5338-8
- By:
- Publication type:
- Article
Current State of the Mixed-Signal Test Bus 1149.4.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 857, doi. 10.1007/s10836-012-5339-7
- By:
- Publication type:
- Article
Editorial.
- Published in:
- 2012
- By:
- Publication type:
- Editorial
Prediction of Long-term Immunity of a Phase-Locked Loop.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 791, doi. 10.1007/s10836-012-5335-y
- By:
- Publication type:
- Article