Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 641, doi. 10.1007/s10836-012-5293-4
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 5
Results: 19
1
2
High Speed On-Chip Signal Generation for Debug and Diagnosis.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 625, doi. 10.1007/s10836-012-5289-0
- By:
- Publication type:
- Article
3
Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 745, doi. 10.1007/s10836-012-5301-8
- By:
- Publication type:
- Article
4
Experimental Results of Testing a BIST Σ-Δ ADC on the HOY Wireless Test Platform.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 571, doi. 10.1007/s10836-012-5302-7
- By:
- Publication type:
- Article
5
On the Use of Static Temperature Measurements as Process Variation Observable.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 685, doi. 10.1007/s10836-012-5298-z
- By:
- Publication type:
- Article
6
An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 733, doi. 10.1007/s10836-012-5310-7
- By:
- Publication type:
- Article
7
Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 653, doi. 10.1007/s10836-012-5299-y
- By:
- Publication type:
- Article
8
Built-in Self Test of RF Subsystems with Integrated Detectors.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 557, doi. 10.1007/s10836-012-5315-2
- By:
- Publication type:
- Article
9
Novel Practical Built-in Current Sensors.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 673, doi. 10.1007/s10836-012-5313-4
- By:
- Publication type:
- Article
10
Maximizing Parallel Testing in an FM Receiver.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 723, doi. 10.1007/s10836-012-5323-2
- By:
- Publication type:
- Article
11
On Chip Signal Generators for Low Overhead ADC BIST.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 615, doi. 10.1007/s10836-012-5320-5
- By:
- Publication type:
- Article
12
An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 705, doi. 10.1007/s10836-012-5325-0
- By:
- Publication type:
- Article
13
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 553, doi. 10.1007/s10836-012-5328-x
- Publication type:
- Article
14
Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 757, doi. 10.1007/s10836-012-5326-z
- By:
- Publication type:
- Article
15
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 585, doi. 10.1007/s10836-012-5324-1
- By:
- Publication type:
- Article
16
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing.
- Published in:
- 2012
- By:
- Publication type:
- Editorial
17
Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 697, doi. 10.1007/s10836-012-5327-y
- By:
- Publication type:
- Article
18
Editorial.
- Published in:
- 2012
- By:
- Publication type:
- Editorial
19
FPGA-based Novel Adaptive Scheme Using PN Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial Sensors.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 599, doi. 10.1007/s10836-012-5336-x
- By:
- Publication type:
- Article