Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 4

Results: 14

Editorial.

Published in:

2012

By:

Agrawal, Vishwani

Publication type:

Editorial

Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing.

Published in:

2012

By:

Sindia, Suraj;
Agrawal, Vishwani;
Singh, Virendra

Publication type:

Letter

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2012, v. 28, n. 4, p. 391, doi. 10.1007/s10836-012-5317-0
Publication type:: Article

Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 421, doi. 10.1007/s10836-012-5297-0

By:

Freijedo, Judit;
Semião, Jorge;
Rodriguez-Andina, Juan;
Vargas, Fabian;
Teixeira, Isabel;
Teixeira, J.

Publication type:

Article

On the Reuse of TLM Mutation Analysis at RTL.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 435, doi. 10.1007/s10836-012-5303-6

By:

Guarnieri, Valerio;
Di Guglielmo, Giuseppe;
Bombieri, Nicola;
Pravadelli, Graziano;
Fummi, Franco;
Hantson, Hanno;
Raik, Jaan;
Jenihhin, Maksim;
Ubar, Raimund

Publication type:

Article

Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 487, doi. 10.1007/s10836-012-5306-3

By:

Tadeusiewicz, Michał;
Hałgas, Stanisław

Publication type:

Article

Cohesive Coverage Management: Simulation Meets Formal Methods.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 449, doi. 10.1007/s10836-012-5308-1

By:

Hazra, Aritra;
Ghosh, Priyankar;
Dasgupta, Pallab;
Chakrabarti, Partha

Publication type:

Article

BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 405, doi. 10.1007/s10836-012-5304-5

By:

Sen, Shreyas;
Banerjee, Aritra;
Natarajan, Vishwanath;
Devarakond, Shyam;
Choi, Hyun;
Chatterjee, Abhijit

Publication type:

Article

Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 511, doi. 10.1007/s10836-012-5312-5

By:

Viilukas, Taavi;
Karputkin, Anton;
Raik, Jaan;
Jenihhin, Maksim;
Ubar, Raimund;
Fujiwara, Hideo

Publication type:

Article

Time-Constraint-Aware Optimization of Assertions in Embedded Software.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 469, doi. 10.1007/s10836-012-5316-1

By:

Izosimov, Viacheslav;
Guglielmo, Giuseppe;
Lora, Michele;
Pravadelli, Graziano;
Fummi, Franco;
Peng, Zebo;
Fujita, Masahiro

Publication type:

Article

Yield Improvement for 3D Wafer-to-Wafer Stacked Memories.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 523, doi. 10.1007/s10836-012-5314-3

By:

Taouil, Mottaqiallah;
Hamdioui, Said

Publication type:

Article

FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 495, doi. 10.1007/s10836-012-5318-z

By:

Bombieri, Nicola;
Fummi, Franco;
Guarnieri, Valerio

Publication type:

Article

A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 535, doi. 10.1007/s10836-012-5311-6

By:

Ahmed, Badar-ud-din;
Youren, Wang;
Ullah, Rizwan;
Ahmed, Najam-ud-din

Publication type:

Article

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 4, p. 393, doi. 10.1007/s10836-012-5309-0

By:

Sheng, Xiaoqin;
Kerkhoff, Hans;
Zjajo, Amir;
Gronthoud, Guido

Publication type:

Article