Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 4
Results: 14
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 421, doi. 10.1007/s10836-012-5297-0
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- Publication type:
- Article
On the Reuse of TLM Mutation Analysis at RTL.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 435, doi. 10.1007/s10836-012-5303-6
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- Publication type:
- Article
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 487, doi. 10.1007/s10836-012-5306-3
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- Publication type:
- Article
Cohesive Coverage Management: Simulation Meets Formal Methods.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 449, doi. 10.1007/s10836-012-5308-1
- By:
- Publication type:
- Article
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing.
- Published in:
- 2012
- By:
- Publication type:
- Letter
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 405, doi. 10.1007/s10836-012-5304-5
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 391, doi. 10.1007/s10836-012-5317-0
- Publication type:
- Article
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 511, doi. 10.1007/s10836-012-5312-5
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- Publication type:
- Article
Editorial.
- Published in:
- 2012
- By:
- Publication type:
- Editorial
Time-Constraint-Aware Optimization of Assertions in Embedded Software.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 469, doi. 10.1007/s10836-012-5316-1
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- Publication type:
- Article
Yield Improvement for 3D Wafer-to-Wafer Stacked Memories.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 523, doi. 10.1007/s10836-012-5314-3
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- Publication type:
- Article
FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 495, doi. 10.1007/s10836-012-5318-z
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- Publication type:
- Article
A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 535, doi. 10.1007/s10836-012-5311-6
- By:
- Publication type:
- Article
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 393, doi. 10.1007/s10836-012-5309-0
- By:
- Publication type:
- Article