Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 3

Results: 12

Iterative Antirandom Testing.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 301, doi. 10.1007/s10836-011-5272-1

By:

Mrozek, Ireneusz;
Yarmolik, Vyacheslav

Publication type:

Article

Challenges for Semiconductor Test Engineering: A Review Paper.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 365, doi. 10.1007/s10836-011-5276-x

By:

Vock, Stefan;
Escalona, Omar;
Turner, Colin;
Owens, Frank

Publication type:

Article

A New Optimal Test Node Selection Method for Analog Circuit.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 279, doi. 10.1007/s10836-011-5274-z

By:

Luo, Hui;
Wang, Youren;
Lin, Hua;
Jiang, Yuanyuan

Publication type:

Article

Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 291, doi. 10.1007/s10836-011-5275-y

By:

Long, Bing;
Tian, Shulin;
Wang, Houjun

Publication type:

Article

Optimization of SEU Simulations for SRAM Cells Reliability under Radiation.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 331, doi. 10.1007/s10836-012-5281-8

By:

Castellani-Coulié, K.;
Aziza, H.;
Micolau, G.;
Portal, J-M.

Publication type:

Article

NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 349, doi. 10.1007/s10836-012-5295-2

By:

Ferri, Cesare;
Papagiannopoulou, Dimitra;
Bahar, R.;
Calimera, Andrea

Publication type:

Article

Digital-Compatible Testing Scheme for Operational Amplifier.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 267, doi. 10.1007/s10836-012-5290-7

By:

Ting, Hsin-Wen

Publication type:

Article

IC Immunity Modeling Process Validation Using On-Chip Measurements.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 339, doi. 10.1007/s10836-012-5294-3

By:

Ben Dhia, S.;
Boyer, A.;
Vrignon, B.;
Deobarro, M.

Publication type:

Article

Robust Coupling Delay Test Sets.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 375, doi. 10.1007/s10836-012-5292-5

By:

Yi, Joonhwan;
Hayes, John

Publication type:

Article

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 3, p. 317, doi. 10.1007/s10836-012-5291-6

By:

Alves Fonseca, Renan;
Dilillo, Luigi;
Bosio, Alberto;
Girard, Patrick;
Pravossoudovitch, Serge;
Virazel, Arnaud;
Badereddine, Nabil

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2012, v. 28, n. 3, p. 265, doi. 10.1007/s10836-012-5300-9
Publication type:: Article

Editorial.

Published in:

2012

By:

Agrawal, Vishwani

Publication type:

Editorial