Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 2

Results: 11

Diagnostic Test Set Minimization and Full-Response Fault Dictionary.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 177, doi. 10.1007/s10836-012-5286-3

By:

Shukoor, Mohammed;
Agrawal, Vishwani

Publication type:

Article

Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 243, doi. 10.1007/s10836-011-5266-z

By:

Zhao, Yang;
Chakrabarty, Krishnendu;
Bhattacharya, Bhargab

Publication type:

Article

A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 201, doi. 10.1007/s10836-011-5268-x

By:

Ma, Junxia;
Tehranipoor, Mohammad;
Girard, Patrick

Publication type:

Article

Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 229, doi. 10.1007/s10836-011-5271-2

By:

Thibeault, C.;
Hariri, Y.;
Hobeika, C.

Publication type:

Article

Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 167, doi. 10.1007/s10836-012-5283-6

By:

Ayadi, R.;
Mahresi, S.;
Masmoudi, M.

Publication type:

Article

Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 215, doi. 10.1007/s10836-012-5277-4

By:

Mauroux, P.-D.;
Virazel, A.;
Bosio, A.;
Dilillo, L.;
Girard, P.;
Pravossoudovitch, S.;
Godard, B.;
Festes, G.;
Vachez, L.

Publication type:

Article

Fault Detection of Analog Circuits Using Network Parameters.

Published in:

2012

By:

Kavithamani, A.;
Manikandan, V.;
Devarajan, N.

Publication type:

Letter

Software-Based Testing for System Peripherals.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 189, doi. 10.1007/s10836-012-5287-2

By:

Grosso, M.;
Perez Holguin, W.;
Sanchez, E.;
Sonza Reorda, M.;
Tonda, A.;
Velasco Medina, J.

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2012, v. 28, n. 2, p. 153, doi. 10.1007/s10836-012-5288-1
Publication type:: Article

A Modified Simulation-Based Multi-Signal Modeling for Electronic System.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 155, doi. 10.1007/s10836-011-5273-0

By:

Xiaomei, Chen;
Xiaofeng, Meng;
Guohua, Wang

Publication type:

Article

Editorial.

Published in:

2012

By:

Agrawal, Vishwani

Publication type:

Editorial