Works matching IS 09238174 AND DT 2012 AND VI 28 AND IP 2
Results: 11
Diagnostic Test Set Minimization and Full-Response Fault Dictionary.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 177, doi. 10.1007/s10836-012-5286-3
- By:
- Publication type:
- Article
Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 243, doi. 10.1007/s10836-011-5266-z
- By:
- Publication type:
- Article
A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 201, doi. 10.1007/s10836-011-5268-x
- By:
- Publication type:
- Article
Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 229, doi. 10.1007/s10836-011-5271-2
- By:
- Publication type:
- Article
A Modified Simulation-Based Multi-Signal Modeling for Electronic System.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 155, doi. 10.1007/s10836-011-5273-0
- By:
- Publication type:
- Article
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 215, doi. 10.1007/s10836-012-5277-4
- By:
- Publication type:
- Article
Fault Detection of Analog Circuits Using Network Parameters.
- Published in:
- 2012
- By:
- Publication type:
- Letter
Software-Based Testing for System Peripherals.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 189, doi. 10.1007/s10836-012-5287-2
- By:
- Publication type:
- Article
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 167, doi. 10.1007/s10836-012-5283-6
- By:
- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 153, doi. 10.1007/s10836-012-5288-1
- Publication type:
- Article
Editorial.
- Published in:
- 2012
- By:
- Publication type:
- Editorial