Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 6

Results: 10

Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 697, doi. 10.1007/s10836-011-5252-5

By:

Lin, Jin-Fu;
Ting, Hsin-Wen

Publication type:

Article

Symmetry Measure for Memory Test and Its Application in BIST Optimization.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 753, doi. 10.1007/s10836-011-5251-6

By:

Harutyunyan, Gurgen;
Hakhumyan, Aram;
Shoukourian, Samvel;
Vardanian, Valery;
Zorian, Yervant

Publication type:

Article

Calibrating On-chip Thermal Sensors in Integrated Circuits: A Design-for-Calibration Approach.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 711, doi. 10.1007/s10836-011-5253-4

By:

Yao, Chunhua;
Saluja, Kewal;
Ramanathan, Parmesh

Publication type:

Article

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 787, doi. 10.1007/s10836-011-5258-z

By:

Wan, Min-yong;
Ding, Yong;
Pan, Yun;
Yan, Xiao-lang

Publication type:

Article

Security Against Hardware Trojan Attacks Using Key-Based Design Obfuscation.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 767, doi. 10.1007/s10836-011-5255-2

By:

Chakraborty, Rajat;
Bhunia, Swarup

Publication type:

Article

Band-Pass Filter Design with Diagnosis Facilities Based on Predictive Techniques.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 685, doi. 10.1007/s10836-011-5257-0

By:

Font-Rosselló, Joan;
Isern, Eugeni;
Roca, Miquel;
Picos, Rodrigo;
Font-Rosselló, Miquel;
García-Moreno, Eugenio

Publication type:

Article

Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 723, doi. 10.1007/s10836-011-5265-0

By:

Kao, Chen-Yuan;
Liao, Chien-Hui;
Wen, Charles

Publication type:

Article

Computing the Detection Probability for Small Delay Defects of Nanometer ICs.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 741, doi. 10.1007/s10836-011-5256-1

By:

García-Gervacio, José;
Champac, Victor

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2011, v. 27, n. 6, p. 683, doi. 10.1007/s10836-011-5264-1
Publication type:: Article

Editorial.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 6, p. 681, doi. 10.1007/s10836-011-5267-y

By:

Agrawal, Vishwani

Publication type:

Article