Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 6
Results: 10
Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 697, doi. 10.1007/s10836-011-5252-5
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- Article
Symmetry Measure for Memory Test and Its Application in BIST Optimization.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 753, doi. 10.1007/s10836-011-5251-6
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Calibrating On-chip Thermal Sensors in Integrated Circuits: A Design-for-Calibration Approach.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 711, doi. 10.1007/s10836-011-5253-4
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An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 787, doi. 10.1007/s10836-011-5258-z
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Security Against Hardware Trojan Attacks Using Key-Based Design Obfuscation.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 767, doi. 10.1007/s10836-011-5255-2
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Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 723, doi. 10.1007/s10836-011-5265-0
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- Article
Computing the Detection Probability for Small Delay Defects of Nanometer ICs.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 741, doi. 10.1007/s10836-011-5256-1
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Test Technology Newsletter.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 683, doi. 10.1007/s10836-011-5264-1
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Editorial.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 681, doi. 10.1007/s10836-011-5267-y
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Band-Pass Filter Design with Diagnosis Facilities Based on Predictive Techniques.
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- Journal of Electronic Testing, 2011, v. 27, n. 6, p. 685, doi. 10.1007/s10836-011-5257-0
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- Article