A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnect.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 647, doi. 10.1007/s10836-011-5238-3
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 5
Results: 11
1
2
Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization Techniques.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 657, doi. 10.1007/s10836-011-5239-2
- By:
- Publication type:
- Article
3
Analog Circuit Fault Detection Using Location of Poles.
- Published in:
- 2011
- By:
- Publication type:
- Letter
4
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 599, doi. 10.1007/s10836-011-5243-6
- By:
- Publication type:
- Article
5
A New Design-for-Testability Method Based on Thru-Testability.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 583, doi. 10.1007/s10836-011-5241-8
- By:
- Publication type:
- Article
6
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 581, doi. 10.1007/s10836-011-5250-7
- Publication type:
- Article
7
Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 635, doi. 10.1007/s10836-011-5246-3
- By:
- Publication type:
- Article
8
Wavelet Neural Network Approach for Testing of Switched-Current Circuits.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 611, doi. 10.1007/s10836-011-5248-1
- By:
- Publication type:
- Article
9
Erratum to: A Cost-Efficient Self-Configurable BIST Technique for Testing Multiplexer-Based FPGA Interconnect.
- Published in:
- 2011
- By:
- Publication type:
- Correction Notice
10
Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 5, p. 627, doi. 10.1007/s10836-011-5245-4
- By:
- Publication type:
- Article
11
Editorial.
- Published in:
- 2011
- By:
- Publication type:
- Editorial