Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 4

Results: 14

Functional Verification of DMA Controllers.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 505, doi. 10.1007/s10836-011-5219-6

By:

Grosso, Michelangelo;
Perez Holguin, Wilson;
Ravotto, Danilo;
Sanchez, Ernesto;
Reorda, Matteo;
Tonda, Alberto;
Medina, Jaime

Publication type:

Article

A Java Framework to Specify Faultloads for Fault Injection Campaigns.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 531, doi. 10.1007/s10836-011-5217-8

By:

Munaretti, Ruthiano;
Weber, Taisy;
Cechin, Sérgio;
Fiss, Bruno

Publication type:

Article

Exploring the Limitations of Software-based Techniques in SEE Fault Coverage.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 541, doi. 10.1007/s10836-011-5218-7

By:

Azambuja, José;
Pagliarini, Samuel;
Rosa, Lucas;
Kastensmidt, Fernanda

Publication type:

Article

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 551, doi. 10.1007/s10836-011-5220-0

By:

Gonçalves, Luiz;
Bosa, Jefferson;
Balen, Tiago;
Lubaszewski, Marcelo;
Schneider, Eduardo;
Henriques, Renato

Publication type:

Article

Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 465, doi. 10.1007/s10836-011-5221-z

By:

Subrahmaniyan Radhakrishnan, Gurusubrahmaniyan;
Ozev, Sule

Publication type:

Article

A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 485, doi. 10.1007/s10836-011-5225-8

By:

Castro Márquez, Carlos;
Romero Tobar, Edgar;
Strum, Marius;
Chau, Wang

Publication type:

Article

Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 429, doi. 10.1007/s10836-011-5213-z

By:

Han, Kihyuk;
Park, Joonsung;
Lee, Jae;
Chung, Jaeyong;
Byun, Eonjo;
Woo, Cheol-Jong;
Oh, Sejang;
Abraham, Jacob

Publication type:

Article

An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 477, doi. 10.1007/s10836-011-5232-9

By:

Sun, Haijun;
Zeng, Yongjia;
Li, Pu;
Lei, Shaochong;
Shao, Zhibiao

Publication type:

Article

Histogram-Based Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADCs.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 441, doi. 10.1007/s10836-011-5231-x

By:

Huang, Xuan-Lun;
Kang, Ping-Ying;
Yu, Yuan-Chi;
Huang, Jiun-Lang

Publication type:

Article

An Output Response Analyzer Circuit for ADC Built-in Self-Test.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 455, doi. 10.1007/s10836-011-5235-6

By:

Ting, Hsin-Wen

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2011, v. 27, n. 4, p. 427, doi. 10.1007/s10836-011-5236-5
Publication type:: Article

Test Data Compression Using Selective Sparse Storage.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 565, doi. 10.1007/s10836-011-5234-7

By:

Zhang, Ling;
Kuang, Ji-shun;
You, Zhi-qiang

Publication type:

Article

A Fault Detection Scheme for the FPGA Implementation of SHA-1 and SHA-512 Round Computations.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 517, doi. 10.1007/s10836-011-5237-4

By:

Bahramali, Mohsen;
Jiang, Jin;
Reyhani-Masoleh, Arash

Publication type:

Article

Editorial.

Published in:

2011

By:

Agrawal, Vishwani

Publication type:

Editorial