RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 267, doi. 10.1007/s10836-010-5191-6
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 3
Results: 18
1
2
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 277, doi. 10.1007/s10836-010-5193-4
- By:
- Publication type:
- Article
3
Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 305, doi. 10.1007/s10836-010-5192-5
- By:
- Publication type:
- Article
4
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 335, doi. 10.1007/s10836-011-5194-y
- By:
- Publication type:
- Article
5
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 225, doi. 10.1007/s10836-011-5199-6
- By:
- Publication type:
- Article
6
An Oscillation-Based Technique for Degradation Monitoring of Sensing and Actuation Electrodes Within Microfluidic Systems.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 375, doi. 10.1007/s10836-011-5203-1
- By:
- Publication type:
- Article
7
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 363, doi. 10.1007/s10836-011-5202-2
- By:
- Publication type:
- Article
8
A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 411, doi. 10.1007/s10836-011-5207-x
- By:
- Publication type:
- Article
9
A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 389, doi. 10.1007/s10836-011-5210-2
- By:
- Publication type:
- Article
10
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 241, doi. 10.1007/s10836-011-5212-0
- By:
- Publication type:
- Article
11
Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 351, doi. 10.1007/s10836-011-5216-9
- By:
- Publication type:
- Article
12
Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic Cells.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 403, doi. 10.1007/s10836-011-5226-7
- By:
- Publication type:
- Article
13
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 289, doi. 10.1007/s10836-011-5222-y
- By:
- Publication type:
- Article
14
Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 253, doi. 10.1007/s10836-011-5215-x
- By:
- Publication type:
- Article
15
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 321, doi. 10.1007/s10836-011-5227-6
- By:
- Publication type:
- Article
16
Editorial.
- Published in:
- 2011
- By:
- Publication type:
- Editorial
17
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 221, doi. 10.1007/s10836-011-5230-y
- Publication type:
- Article
18
Guest Editorial.
- Published in:
- 2011
- By:
- Publication type:
- Editorial