Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 1

Results: 11

A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 19, doi. 10.1007/s10836-010-5178-3

By:

Malandruccolo, Vezio;
Ciappa, Mauro;
Rothleitner, Hubert;
Fichtner, Wolfgang

Publication type:

Article

Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined Datapaths.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 9, doi. 10.1007/s10836-010-5186-3

By:

Nummer, Muhammad;
Sachdev, Manoj

Publication type:

Article

Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 57, doi. 10.1007/s10836-010-5180-9

By:

Al-Gayem, Qais;
Liu, Hongyuan;
Richardson, Andrew;
Burd, Nick

Publication type:

Article

Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 43, doi. 10.1007/s10836-010-5185-4

By:

Bin Zhou;
Li-yi Xiao;
Yi-Zheng Ye;
Xin-Chun Wu

Publication type:

Article

A Design of Linearity Built-in Self-Test for Current-Steering DAC.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 85, doi. 10.1007/s10836-010-5187-2

By:

Hsin-Wen Ting;
Soon-Jyh Chang;
Su-Ling Huang

Publication type:

Article

Masking of X-Values by Use of a Hierarchically Configurable Register.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 31, doi. 10.1007/s10836-010-5179-2

By:

Rabenalt, Thomas;
Goessel, Michael;
Leininger, Andreas

Publication type:

Article

Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 69, doi. 10.1007/s10836-010-5190-7

By:

Yang Zhao;
Chakrabarty, Krishnendu

Publication type:

Article

Editorial.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 1, doi. 10.1007/s10836-011-5200-4

By:

Agrawal, Vishwani D.

Publication type:

Article

List of 2010 Reviewers.

Published in:: Journal of Electronic Testing, 2011, v. 27, n. 1, p. 5, doi. 10.1007/s10836-011-5197-8
Publication type:: Article

Test Technology Newsletter.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 1, p. 7, doi. 10.1007/s10836-011-5198-7

By:

Pande, Partha

Publication type:

Article

New Editors.

Published in:: Journal of Electronic Testing, 2011, v. 27, n. 1, p. 3, doi. 10.1007/s10836-011-5201-3
Publication type:: Article