A BIST Solution for Frequency Domain Characterization of Analog Circuits.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 429, doi. 10.1007/s10836-010-5158-7
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2010 AND VI 26 AND IP 4
Results: 9
1
2
Editorial.
- Published in:
- 2010
- By:
- Publication type:
- Editorial
3
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 403, doi. 10.1007/s10836-010-5165-8
- Publication type:
- Article
4
On the Duality of Probing and Fault Attacks.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 483, doi. 10.1007/s10836-010-5160-0
- By:
- Publication type:
- Article
5
A New Built-in TPG Based on Berlekamp–Massey Algorithm.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 443, doi. 10.1007/s10836-010-5155-x
- By:
- Publication type:
- Article
6
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 419, doi. 10.1007/s10836-010-5162-y
- By:
- Publication type:
- Article
7
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 453, doi. 10.1007/s10836-010-5163-x
- By:
- Publication type:
- Article
8
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 465, doi. 10.1007/s10836-010-5159-6
- By:
- Publication type:
- Article
9
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 405, doi. 10.1007/s10836-010-5161-z
- By:
- Publication type:
- Article