Works matching IS 09238174 AND DT 2010 AND VI 26 AND IP 3
Results: 9
Fault Modeling and Analysis for Resistive Bridging Defects in a Synchronizer.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 367, doi. 10.1007/s10836-010-5150-2
- By:
- Publication type:
- Article
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 307, doi. 10.1007/s10836-010-5146-y
- By:
- Publication type:
- Article
False Error Vulnerability Study of On-line Soft Error Detection Mechanisms.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 323, doi. 10.1007/s10836-010-5153-z
- By:
- Publication type:
- Article
Test Technology Newsletter [InlineMediaObject not available: see fulltext.][InlineMediaObject not available: see fulltext.].
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 295, doi. 10.1007/s10836-010-5157-8
- Publication type:
- Article
Editorial.
- Published in:
- 2010
- By:
- Publication type:
- Editorial
One-to-Many: Context-Oriented Code for Concurrent Error Detection.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 337, doi. 10.1007/s10836-009-5139-x
- By:
- Publication type:
- Article
Test Data Compression Using Multi-dimensional Pattern Run-length Codes.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 393, doi. 10.1007/s10836-009-5138-y
- By:
- Publication type:
- Article
Using Evolutionary Algorithms for Signal Integrity Assessment of High-Speed Data Buses.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 297, doi. 10.1007/s10836-010-5141-3
- By:
- Publication type:
- Article
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 3, p. 355, doi. 10.1007/s10836-010-5154-y
- By:
- Publication type:
- Article