On Built-In Self-Test for Adders.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 343, doi. 10.1007/s10836-009-5114-6
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2009 AND VI 25 AND IP 6
Results: 9
1
2
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 309, doi. 10.1007/s10836-009-5113-7
- By:
- Publication type:
- Article
3
A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture Model.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 337, doi. 10.1007/s10836-009-5112-8
- By:
- Publication type:
- Article
4
Low-Area Wrapper Cell Design for Hierarchical SoC Testing.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 347, doi. 10.1007/s10836-009-5117-3
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- Publication type:
- Article
5
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 287, doi. 10.1007/s10836-009-5119-1
- Publication type:
- Article
6
Editorial.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 285, doi. 10.1007/s10836-009-5120-8
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- Publication type:
- Article
7
PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 289, doi. 10.1007/s10836-009-5116-4
- By:
- Publication type:
- Article
8
LPTest: a Flexible Low-Power Test Pattern Generator.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 323, doi. 10.1007/s10836-009-5115-5
- By:
- Publication type:
- Article
9
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 301, doi. 10.1007/s10836-009-5118-2
- By:
- Publication type:
- Article