Editorial.Published in:Journal of Electronic Testing, 2009, v. 25, n. 4/5, p. 209, doi. 10.1007/s10836-009-5111-9By:Vishwani AgrawalPublication type:Article
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range.Published in:Journal of Electronic Testing, 2009, v. 25, n. 4/5, p. 279By:R. FernándezPublication type:Article