Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 2/3, p. 197, doi. 10.1007/s10836-009-5103-9
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2009 AND VI 25 AND IP 2/3
Results: 6
1
2
A Built-in-Self-Test Σ-Δ ADC Prototype.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 2/3, p. 145, doi. 10.1007/s10836-008-5095-x
- By:
- Publication type:
- Article
3
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 2/3, p. 127
- By:
- Publication type:
- Article
4
Test Points Selection for Analog Fault Dictionary Techniques.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 2/3, p. 157, doi. 10.1007/s10836-008-5097-8
- By:
- Publication type:
- Article
5
A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 2/3, p. 187, doi. 10.1007/s10836-008-5091-1
- By:
- Publication type:
- Article
6
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 2/3, p. 169, doi. 10.1007/s10836-008-5092-0
- By:
- Publication type:
- Article