An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.Published in:Journal of Electronic Testing, 2008, v. 24, n. 6, p. 591, doi. 10.1007/s10836-008-5077-zBy:Myung-Hoon Yang;Yongjoon Kim;Sunghoon Chun;Sungho KangPublication type:Article